Philips / FEI (XL30) Scanning Electron Microscope (SEM & ESEM)
Philips / FEI (XL30) Scanning Electron Microscope (SEM & ESEM)
This acquisition by the department sets the standard for scanning electron microscopy. Provision is available for high-resolution secondary electron imaging at high specimen chamber gas pressures or at high vacuum. Most materials can be examined without processing, providing the capability to view wet, dry, hot, and cold samples. Specimens may also be examined in a dynamic state.
Digital images are obtained under hi-vacuum and in environmental scanning modes.
A resolution of 2.5nm is possible along with magnifications to 200,000X.Photo Gallery
Last Modified: 2012-03-09